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Backgating high-current and breakdown characterisation of AlGaN/GaN HEMTs on silicon substrates

Kuzmik, J.; Blaho, M.; Pogany, D. et al.

2003 • In Proceedings of the ESSDERC 2003. Estoril, Portugal, p. 319-322

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102_ESSDERC_2003_319_322.pdf

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