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RF characterization and modeling of AlGaN/GaN based HFETs and MOSHFETs
Fox, A.; Marso, Michel; Heidelberger, G. et al.
2006In Proc. 6th Intern. Conf. Advanced Semicon. Dev. & Microsystems ASDAM’06 (2006)

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146_ASDAM_2006_109-112.pdf

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