References of "Ehre, Florian 50031185"
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See detailDiode Factor in Solar Cells with Metastable Defects and Back Contact Recombination
Wang, Taowen UL; Ehre, Florian UL; Weiss, Thomas UL et al

in Advanced Energy Materials (2022)

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See detailAbsorber composition: A critical parameter for the effectiveness of heat treatments in chalcopyrite solar cells
Sood, Mohit UL; Elanzeery, Hossam UL; Adeleye, Damilola UL et al

in Progress in Photovoltaics (2020)

Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown ... [more ▼]

Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown under Cu-poor conditions but not under Cu excess.. We present a systematic study to understand the effects of HT on CuInSe2 and CuInS2 solar cells. The study is performed for CuInSe2 solar cells grown under Cu-rich and Cu-poor chemical potential prepared with both CdS and Zn(O,S) buffer layers. In addition, we also study Cu-rich CuInS2 solar cells prepared with the suitable Zn(O,S) buffer layer. For Cu-poor selenide device low-temperature HT leads to passivation of bulk, whereas in Cu-rich devices no such passivation was observed. The Cu-rich devices are hampered by a large shunt. The HT decreases shunt resistance in Cu-rich selenides, whereas it increases shunt resistance in Cu-rich sulfides.. The origin of these changes in device performance was investigated with capacitance-voltage measurement which shows the considerable decrease in carrier concentration with HT in Cu-poor CuInSe2, and temperature dependent current-voltage measurements show the presence of barrier for minority carriers. Together with numerical simulations, these findings support a highly-doped interfacial p+ layer device model in Cu-rich selenide absorbers and explain the discrepancy between Cu-poor and Curich device performance. Our findings provide insights into how the same treatment can have a completely different effect on the device depending on the composition of the absorber. [less ▲]

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See detailElectronic defects in Cu(In,Ga)Se2: Towards a comprehensive model
Spindler, Conrad UL; Babbe, Finn UL; Wolter, Max UL et al

in Physical Review Materials (2019), 3

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