References of "Voigt, Axel"
     in
Bookmark and Share    
Full Text
Peer Reviewed
See detailThe Orchestration Stack: The Impossible Task of Designing Software for Unknown Future Post-CMOS Hardware
Volp, Marcus UL; Klüppelholz, Sascha; Castrillon, Jeronimo et al

Scientific Conference (2016, November 14)

Future systems based on post-CMOS technologies will be wildly heterogeneous, with properties largely unknown today. This paper presents our design of a new hardware/software stack to address the challenge ... [more ▼]

Future systems based on post-CMOS technologies will be wildly heterogeneous, with properties largely unknown today. This paper presents our design of a new hardware/software stack to address the challenge of preparing software development for such systems. It combines well-understood technologies from different areas, e.g., network-on-chips, capability operating systems, flexible programming models and model checking. We describe our approach and provide details on key technologies. [less ▲]

Detailed reference viewed: 182 (13 UL)
Full Text
Peer Reviewed
See detailSpiral growth and step edge barriers
Redinger, Alex UL; Ricken, Oliver; Kuhn, Philipp et al

in PHYSICAL REVIEW LETTERS (2008), 100(3),

The growth of spiral mounds containing a screw dislocation is compared to the growth of wedding cakes by two-dimensional nucleation. Using phase field simulations and homoepitaxial growth experiments on ... [more ▼]

The growth of spiral mounds containing a screw dislocation is compared to the growth of wedding cakes by two-dimensional nucleation. Using phase field simulations and homoepitaxial growth experiments on the Pt(111) surface we show that both structures attain the same large scale shape when a significant step-edge barrier suppresses interlayer transport. The higher vertical growth rate of the spiral mounds on Pt(111) reflects the different incorporation mechanisms for atoms in the top region and can be formally represented by an enhanced apparent step-edge barrier. [less ▲]

Detailed reference viewed: 91 (2 UL)