Over 15% efficient wide-band-gap Cu(In,Ga)S2 solar cell: Suppressing bulk and interface recombination through composition engineeringShukla, Sudhanshu ; Sood, Mohit ; Adeleye, Damilola et alin Joule (2021), 5 Detailed reference viewed: 53 (4 UL) Carrier recombination mechanism and photovoltage deficit in 1.7-eV band gap near-stoichiometric Cu(In,Ga)S2Shukla, Sudhanshu ; Adeleye, Damilola ; Sood, Mohit et alin Physical Review Materials (2021), 5 Detailed reference viewed: 32 (5 UL) Lifetime, quasi-Fermi level splitting and doping concentration of Cu-rich CuInS2 absorbersAdeleye, Damilola ; Lomuscio, Alberto ; Sood, Mohit et alin Materials Research Express (2021), 8 Detailed reference viewed: 108 (8 UL) Waste- and Cd-Free Inkjet-Printed Zn(O,S) Buffer for Cu(In,Ga)(S,Se)2 Thin-Film Solar CellsChu, van Ben ; Siopa, Daniel ; Debot, Alice et alin ACS Applied Materials and Interfaces (2021), 13 Detailed reference viewed: 79 (2 UL) Absorber composition: A critical parameter for the effectiveness of heat treatments in chalcopyrite solar cellsSood, Mohit ; Elanzeery, Hossam ; Adeleye, Damilola et alin Progress in Photovoltaics (2020) Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown ... [more ▼] Post-device heat treatment (HT) in chalcopyrite [Cu(In,Ga)(S,Se)2] solar cells is known to improve the performance of the devices. However, this HT is only beneficial for devices made with absorbers grown under Cu-poor conditions but not under Cu excess.. We present a systematic study to understand the effects of HT on CuInSe2 and CuInS2 solar cells. The study is performed for CuInSe2 solar cells grown under Cu-rich and Cu-poor chemical potential prepared with both CdS and Zn(O,S) buffer layers. In addition, we also study Cu-rich CuInS2 solar cells prepared with the suitable Zn(O,S) buffer layer. For Cu-poor selenide device low-temperature HT leads to passivation of bulk, whereas in Cu-rich devices no such passivation was observed. The Cu-rich devices are hampered by a large shunt. The HT decreases shunt resistance in Cu-rich selenides, whereas it increases shunt resistance in Cu-rich sulfides.. The origin of these changes in device performance was investigated with capacitance-voltage measurement which shows the considerable decrease in carrier concentration with HT in Cu-poor CuInSe2, and temperature dependent current-voltage measurements show the presence of barrier for minority carriers. Together with numerical simulations, these findings support a highly-doped interfacial p+ layer device model in Cu-rich selenide absorbers and explain the discrepancy between Cu-poor and Curich device performance. Our findings provide insights into how the same treatment can have a completely different effect on the device depending on the composition of the absorber. [less ▲] Detailed reference viewed: 142 (8 UL) Phonon coupling and shallow defects in CuInS2Lomuscio, Alberto ; Sood, Mohit ; Melchiorre, Michele et alin Physical Review. B (2020), 101(8), 085119- Detailed reference viewed: 228 (20 UL) Chemical instability at chalcogenide surfaces impacts chalcopyrite devices well beyond the surfaceColombara, Diego ; Elanzeery, Hossam ; et alin Nature Communications (2020) Detailed reference viewed: 211 (5 UL) Challenge in Cu-rich CuInSe2 thin film solar cells: Defect caused by etchingElanzeery, Hossam ; Melchiorre, Michele ; Sood, Mohit et alin Physical Review Materials (2019), 3 Detailed reference viewed: 169 (13 UL) |
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