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Tuning the spectral sensitivity of vertical InN nanopyramid based photodetectors by means of band gap engineering and/or nanostructure size control
Trellenkamp, Stefan; Mikulics, Martin; Winden, Andreas et al.
2012In ASDAM 2012, The Ninth International Conference on Advanced Semiconductor Devices and Microsystems
 

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Disciplines :
Electrical & electronics engineering
Author, co-author :
Trellenkamp, Stefan;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Mikulics, Martin;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Winden, Andreas;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Adam, Roman;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-6) and JARA – Fundamentals of Future Information Technologies
Moers, Jürgen;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Marso, Michel ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Engineering Research Unit
Grützmacher, Detlev;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Hardtdegen, Hilde;  Forschungszentrum Jülich, 52425 Jülich, Germany > Peter Grünberg Institute (PGI-9) and JARA – Fundamentals of Future Information Technologies
Language :
English
Title :
Tuning the spectral sensitivity of vertical InN nanopyramid based photodetectors by means of band gap engineering and/or nanostructure size control
Publication date :
2012
Event name :
ASDAM 2012, The Ninth International Conference on Advanced Semiconductor Devices and Microsystems
Event place :
Smolenice, Slovakia
Event date :
from 11-11-2012 to 15-11-2012
Audience :
International
Main work title :
ASDAM 2012, The Ninth International Conference on Advanced Semiconductor Devices and Microsystems
ISBN/EAN :
978-1-4673-1195-3
Pages :
223 - 226
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