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Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Henard, Christopher; Papadakis, Mike; Perrouin, Gilles et al.
2012
 

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Keywords :
SPL; Testing; T-wise Interactions; Search-based; Prioritization; Similarity
Abstract :
[en] Software Product Lines (SPLs) are families of products whose commonalities and variability can be captured by Feature Models (FMs). T-wise testing aims at finding errors triggered by all interactions amongst t features, thus reducing drastically the number of products to test. T-wise testing approaches for SPLs are limited to small values of t -- which miss faulty interactions -- or limited by the size of the FM. Furthermore, they neither prioritize the products to test nor provide means to finely control the generation process. This paper offers (a) a search-based approach capable of generating products for large SPLs, forming a scalable and flexible alternative to current techniques and (b) prioritization algorithms for any set of products. Experiments conducted on 124 FMs (including large FMs such as the Linux kernel) demonstrate the feasibility and the practicality of our approach.
Disciplines :
Computer science
Identifiers :
UNILU:UL-CHAPTER-2012-830
Author, co-author :
Henard, Christopher ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Papadakis, Mike ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Perrouin, Gilles ;  University of Namur, Belgium
Klein, Jacques ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Heymans, Patrick;  University of Namur, Belgium
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
Language :
English
Title :
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines
Publication date :
2012
Publisher :
Technical Report
ISBN/EAN :
9782879711157
Commentary :
Technical Report
Available on ORBilu :
since 18 August 2013

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