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Speeding-Up Mutation Testing via Data Compression and State Infection
Zhu, Qianqian; Panichella, Annibale; Zaidman, Andy
2017In IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) 2017
Peer reviewed
 

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Keywords :
Mutation Testing; Formal Concept Analysis
Abstract :
[en] Mutation testing is widely considered as a high-end test criterion due to the vast number of mutants it generates. Although many efforts have been made to reduce the computational cost of mutation testing, its scalability issue remains in practice. In this paper, we introduce a novel method to speed up mutation testing based on state infection information. In addition to filtering out uninfected test executions, we further select a subset of mutants and a subset of test cases to run leveraging data-compression techniques. In particular, we adopt Formal Concept Analysis (FCA) to group similar mutants together and then select test cases to cover these mutants. To evaluate our method, we conducted an experimental study on six open source Java projects. We used EvoSuite to automatically generate test cases and to collect mutation data. The initial results show that our method can reduce the execution time by 83.93% with only 0.257% loss in precision.
Disciplines :
Computer science
Author, co-author :
Zhu, Qianqian;  Delft University of Technology > EWI
Panichella, Annibale ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Zaidman, Andy;  Delft University of Technology > EWI
External co-authors :
yes
Language :
English
Title :
Speeding-Up Mutation Testing via Data Compression and State Infection
Publication date :
13 March 2017
Event name :
IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Event place :
Tokyo, Japan
Event date :
from 13-03-2017 to 17-03-2017
Audience :
International
Main work title :
IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) 2017
Publisher :
IEEE
ISBN/EAN :
978-1-5090-6676-6
Pages :
103-109
Peer reviewed :
Peer reviewed
Focus Area :
Security, Reliability and Trust
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since 27 April 2017

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