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“Overloaded!” — A Model-based Approach to Database Stress Testing
Meira, Jorge Augusto; Almeira, Eduardo Cunha de; Kim, Dongsun et al.
2016In International Conference on Database and Expert Systems Applications, Porto 5-8 September 2016
Peer reviewed
 

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Keywords :
big data; stress testing; databases
Disciplines :
Computer science
Author, co-author :
Meira, Jorge Augusto ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Almeira, Eduardo Cunha de;  Federal University of Paraná > Informatics
Kim, Dongsun ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Filho, Edson Ramiro Lucas
Le Traon, Yves ;  University of Luxembourg > Faculty of Science, Technology and Communication (FSTC) > Computer Science and Communications Research Unit (CSC)
External co-authors :
yes
Language :
English
Title :
“Overloaded!” — A Model-based Approach to Database Stress Testing
Publication date :
2016
Event name :
27th International Conference on Database and Expert Systems Applications - DEXA 2016
Event date :
from 05-09-2016 to 08-09-2016
Main work title :
International Conference on Database and Expert Systems Applications, Porto 5-8 September 2016
Peer reviewed :
Peer reviewed
Focus Area :
Computational Sciences
Available on ORBilu :
since 13 October 2016

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