Paper published in a book (Scientific congresses, symposiums and conference proceedings)
Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction
Ramalingam, Srikumar; Goncalves Almeida Antunes, Michel; Snow, Daniel et al.
2015In IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Peer reviewed
 

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Keywords :
line matching; 3D Reconstruction
Disciplines :
Computer science
Author, co-author :
Ramalingam, Srikumar;  Mitsubishi Electric Research Laboratories (MERL)
Goncalves Almeida Antunes, Michel ;  University of Luxembourg > Interdisciplinary Centre for Security, Reliability and Trust (SNT)
Snow, Daniel;  Mitsubishi Electric Research Laboratories (MERL)
Lee, Gim Hee;  Mitsubishi Electric Research Laboratories (MERL)
Pillai, Sudeep;  Massachussetts Institute of Technology (MIT)
External co-authors :
yes
Language :
English
Title :
Line-Sweep: Cross-Ratio for Wide-Baseline Matching and 3D Reconstruction
Publication date :
2015
Event name :
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Event date :
7-06-2015 to 12-06-2015
Audience :
International
Main work title :
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Peer reviewed :
Peer reviewed
Available on ORBilu :
since 14 April 2015

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