Article (Scientific journals)
Spatially resolved raman spectroscopy of single- and few-layer graphene
Graf, D.; Molitor, F.; Ensslin, K. et al.
2007In Nano Letters, 7 (2), p. 238-242
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Abstract :
[en] We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.
Disciplines :
Physics
Author, co-author :
Graf, D.;  ETH Zurich > Solid State Physics Laboratory
Molitor, F.;  ETH Zurich > Solid State Physics Laboratory
Ensslin, K.;  ETH Zurich > Solid State Laboratory
Stampfer, C.;  ETH Zurich > Micro and Nanosystems
Jungen, A.;  ETH Zurich > Micro and Nanosystems
Hierold, C.;  ETH Zurich > Micro and Nanosystems
Wirtz, Ludger ;  CNRS-UMR 8520 > Institute for Electronics, Microelectronics, and Nanotechnology
Language :
English
Title :
Spatially resolved raman spectroscopy of single- and few-layer graphene
Publication date :
2007
Journal title :
Nano Letters
ISSN :
1530-6992
Publisher :
American Chemical Society, Washington, United States - District of Columbia
Volume :
7
Issue :
2
Pages :
238-242
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBilu :
since 11 November 2013

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